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Powerful testing equipment from OPTO SYSTEM Co. Ltd
to perform complex measurements on a large number of optoelectronic or power devices in the shortest time.

Powerful testing equipment and probers from Opto System Co. Ltd.

Perform complex measurements on a large number of devices in the shortest time.

Opto System is happy to deliver a high performance chip handler using your own or another vendor’s tester.

Opto System Automotive power device Tester

Since 2004, Opto System has steadily grown to be probably the largest supplier for tester handlers for Japanese automotive power semiconductors. Opto System’s know-how for pick-and-place and tester integration have created a reputation of its own. Reliable, large scale and high throughput handlers that adapt to diverse tester manufacturers and specific customer requirements.

Opto System Laser Diode Bar Tester VMSB3000

The fully automatic tester is specifically designed to test edge-emitting laser diode bars. Each emitter on the bar can measured for spectrum, I/V, I/P and far field beam pattern on a dedicated stage with controlled temperature. This tester provides precise high throughput characterization.

Opto System Laser Diode Chip Tester VMS3100

The full automatic chip tester is specifically designed to test edge-emitting laser diodes. The machine provides full characterization of spectrum, I/V and I/P at one controlled temperature.

Opto System Laser Diode Chip Tester VMS3200

The full automatic chip tester is specifically designed to test edge-emitting laser diodes. The machine provides full characterization of spectrum, I/V and I/P at two controlled temperatures.

Opto System Laser Diode Chip Tester VMS3300

The full automatic chip tester is specifically designed to test edge-emitting laser diodes. The machine provides full characterization of spectrum, I/V and I/P at three controlled temperatures.

Opto System VCSEL wafer package Tester VMSF3000

The VMSF3000 works either with a tray with packaged VCSELs or with bare dies. All VCSELs are thouroughly characterized in a full-automatic fashion.

Opto System Wafer Prober WPF4000

The robust and reliable aspect of this tool has made it very successful among semiconductor manufacturing customers around the world. A current very large application case is the testing of BAW and SAW filters.

Opto System Wafer Prober WPF6000

The robust and reliable aspect of this tool has made it very successful among semiconductor manufacturing customers around the world. A current very large application case is the testing of BAW and SAW filters. The supply table handles 6″ wafers.

Opto System Wafer Prober WPF8000

The robust and reliable aspect of this tool has made it very successful among semiconductor manufacturing customers around the world. A current very large application case is the testing of BAW and SAW filters. The supply table handles 8″ wafers.

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